High-Resolution Performance Mapping for Multijunction Photovoltaics

Resolving Subcell Efficiency, Layer Uniformity, and Defects

Multijunction photovoltaic solar cells have emerged as a critical technology for surpassing the efficiency limits of conventional single-junction devices, enabling higher power conversion by harvesting a broader portion of the solar spectrum. These devices are increasingly important for applications ranging from space power systems, telecommunications, low-earth orbit cubesats, next-generation photovoltaics, and space exploration.

Photon’s hyperspectral imaging technology enables researchers and manufacturers to optimize multijunction devices through the combination of high-resolution microscopy and spectrally resolved analysis, revealing spatial variations in bandgap performance, material quality, layer uniformity, and defect sites across individual subcells.

With support for photometrically calibrated PLQY, implied Voc, and bandgap (Eg) measurements, as well as multiple excitation sources and a wide spectral range from 400–1620 nm, the IMA microscope provides a powerful platform for mapping optical and electronic behavior with exceptional precision. This hyperspectral approach accelerates failure analysis, process optimization, and performance validation for advanced multijunction solar cell architectures.