Optics Letters
- Advanced materials
- Metrology
Broadband Spectral Transmittance Measurements of Complex Thin-Film Filters With Optical Densities of Up to 12
Authors Simona Liukaityte, Michel Lequime, Myriam Zerrad, Thomas Begou, and Claude Amra
Abstract
A new transmittance measurement setup, based on the use of a tunable laser source and a low-noise scientific-grade CCD camera operating in perfect integration mode, is proposed to achieve the spectrally resolved characterization of thin-film filters with optical densities from 0 to 12 in a wavelength range between 400 and 1000 nm. The first experimental results obtained on dedicated components demonstrate the efficiency of this new measurement scheme.