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Optics Letters

  • Advanced materials
  • Metrology

Broadband Spectral Transmittance Measurements of Complex Thin-Film Filters With Optical Densities of Up to 12

Authors Simona Liukaityte, Michel Lequime, Myriam Zerrad, Thomas Begou, and Claude Amra


A new transmittance measurement setup, based on the use of a tunable laser source and a low-noise scientific-grade CCD camera operating in perfect integration mode, is proposed to achieve the spectrally resolved characterization of thin-film filters with optical densities from 0 to 12 in a wavelength range between 400 and 1000 nm. The first experimental results obtained on dedicated components demonstrate the efficiency of this new measurement scheme.